Model 4950-P01 SPE Multifunction Probe
Single Pair Ethernet Testing Solution
For use with the Model 4950 Channel Emulator
The Telebyte 4950-P01 SPE Multifunction Probe test instrument is designed specifically for testing Single Pair Ethernet (SPE) 10BASE-T1L with Power over Dataline (PoDL) as defined in the Ethernet-APL Data Test Specification v1.5, Power Test Specification v1.2 and the IEEE 802.3-2022 standard.
This specialized instrument is used with the Model 4950 Channel Emulator to test a wide range of Power Source Ports (PSE) and Powered Device (PD or Load) ports in applications such as Auto-Negotiation Tests, Transmitter Tests, BER Receiver Test, Power coupling and decoupling, noise generation (including background and impulsive noise), noise capture to replicate field environments in the lab, Power Spectral Density (PSD) and power level measurements, Transmitter clock frequency, distortion and jitter measurements, Voltage Droop, MDI Return Loss, PoDL / SPoE measurements and more.
This physical layer compliance test solution ensures interoperability between different designs and applications offered by hardware vendors. It features a variety of functions designed to enable and simplify automation of a universal test setup with no manual changes of patch cables or test fixtures (e.g., jigs, baluns) in the test setup.
The Model 4950-P01 SPE Probe is used with the Telebyte Model 4950 SPE Cable Emulator (see separate datasheet). This test suite facilitates multivendor interoperability, performance testing on different twisted pair cable lengths and noise environments, and compliance testing using the Ethernet-APL Worst Case Communication Channels for Trunk or Spur ports.
See this product being used in Telebyte’s Ethernet-APL Testing Solutions
Highlights
- Coupling and Decoupling of Power
- Use the Probe to replace baluns or other voltage (or current clamping) test fixtures
- Calibrated and precise signal output
- Voltage Sense lines for Programmable Power Supply or Programmable Load accuracy
- Signal / Noise Generation
- Arbitrary Wave Form Generator (AWG) path to DUT
- Import real-world noise from capture card
- Generate sinusoidal 1Vpp 1MHz signal for transmitter distortion test
- Generate PAM3 signals for Physical Coding Sublayer (PCS) testing
- Digital Analyzer
- Connect to Digital Storage Oscilloscope
- 100ohm to 50ohm characteristic impedance change
- Protect Test Instruments from voltage and current
- 0dB or 20dB signal attenuation
- Testing on both sides of network simultaneously
- DUT Connection
- Multifunction Features
- High Impedance Probe
- Coupling / Decoupling DC Power
- VNA Connections
- Voltage Remote Sense Connection
- Termination – 100ohm
- Distortion Circuit
- PCS Link Partner
- DC Power Supply Input
- Bandwidth 100kHz to 100MHz
- Controlled by Test Automation Software via the Model 4950 on USB 2.0